specialist distributors of connectors and cable technology
Call +44 (0)1494 791336
Email sales@jacarem.co.uk
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BS EN ISO 9001:2000 quality standard
Test Clips and Oscilloscope Probes
product brochure- Test adapters and oscilloscope probes are designed especially for testing dual-in-line IC packages on high-density PC boards. Many of the test clips and probes are specifically designed for ultra-dense packaged chips located adjacent to each other. As chip packages shrink the ability to test becomes increasingly challenging. Test clips and probes can readily assist the user looking for a cost-effective means of testing signals at the chip level.
- Allow hands-free testing and debugging of ICs soldered onto PCB.
- Test points provide quick connection of test cable assemblies, test probes, or wire wraps. Most models provide signal labelling.
Popular Test Clip Styles:
SSOP, TSOP, SOIC, SOJ, QFP, DIP, PLCC.
Information required for finding the correct part number (or sending through an enquiry):
*IC Package information including part number and package outline drawing. *The clearance distance between the IC & other components. *Preferred features such as locking clip, test lead or connector style test lead pitch etc.
Take the strain out of finding a new connector for your application.
Simply fill in your requirements below and we will come back to you with some potential solutions within 4 working hours.
